Entegra is a Native American-owned small business and provides instruments for metrology and calibration services.

Publications

Entegra Corporation and their employees have produced numerous publications, articles and marketing materials in many different areas of service. The following information is provided:
Title:  Pulse Parameter Dependence on Transition Occurrence Instant and Waveform Epoch
Published:  IEEE Transactions on Instrumentation and Measurement, Vol. 54, No. 4, August 2005
Abstract: The pulse parameters of amplitude and transition duration are dependent on the waveform epoch and transition occurrence instant of the pulse transition in the waveform epoch.  The primary explanations for the observed variations are the pulse aberrations and settling behavior of both the pulse generator and the measurement instrument (sampling oscilloscope).  Measurement results are included for three pulse generators and two sampling oscilloscopes.
Keywords:  picosecond, pulse parameter, sampling oscilloscope, settling error, transition duration
Research Areas:  Ultrawideband, Electromagnetics
 ——————————————————————————————————————————————————————————
Title:  A measurement of propagation delay
Published:  Metrologia, Vol. 44, pp 64-68 (2007)
Abstract: A measurement method and associated uncertainty analysis have been developed for the measurement of propagation or group delay in electrical transmission lines and optical fibres. The measurement method and uncertainty analysis were applied to measurements of optical fibre delay lines that introduce tens of microseconds of delay (1 km, 2 km and 4 km fibre lengths) and trombone lines that introduce sub-nanosecond delays. For the measurement method described here, uncertainties in the measured delay are as low as 90 fs (95% confidence interval) for a propagation delay of 660 ps and less than 200 ps (95% confidence interval) for a propagation delay of 20 μs.
Keywords:  delay, optical fibre, picosecond, nanosecond, uncertainty
Research Areas:  Ultrawideband, Electromagnetics
  ——————————————————————————————————————————————————————————
Title:  Using the Nose-to-Nose Sampler Calibration Method in Pulse Metrology
Published:  11th IMEKO TC-4 Symp. – Trends in Electrical Measurement and Instrumentation – September 13-14, 2001 – Lisbon, Portugal
Abstract: We present our analysis of the nose-to-nose (ntn) method for use as an accurate sampler calibration method. The variations in the measurement of the sampler impulse response using the ntn method are described and the assertion that the kick-out pulse is identical to the sampler impulse response is assessed. Temperature effects on the ntn method are also examined. Finally, the effect of uncertainties in the ntn calibration method on the uncertainties in reported pulse parameters is examined.
Keywords:  sampler calibration, nose-to-nose, kick-out pulse, offset voltage
  ——————————————————————————————————————————————————————————
Title: Nanosecond Delay With Subpicosecond Uncertainty (Adobe PDF)
Published: Review of Scientific Instruments, Vol. 78, 084701, 2007
Abstract: We have combined a commercially available, variable length coaxial delay line (trombone line) with a high resolution linear translation system. The result is better resolution and lower uncertainty in the achievable delays than previously available. The range of delay is 0 ps to approximately 1250 ps, the bidirectional resolution is 2.0 ps, the unidirectional resolution is 0.2 ps, and the uncertainty in the measured delay is +/-0.09 ps. Drift, temperature dependence of delay, repeatability, linearity, and hysteresis were also examined.
Keywords: delay, linearity, nanosecond, picosecond, temperature dependence, uncertainty
Research Areas: Ultrawideband, Electromagnetics
——————————————————————————————————————————————————————————
Title: Using the Nose-to-Nose Sampler Calibration Method in Pulse Metrology
Published: 11th IMEKO TC-4 Symp. – Trends in Electrical Measurement and Instrumentation – September 13-14, 2001 – Lisbon, Portugal
Abstract: We present our analysis of the nose-to-nose (ntn) method for use as an accurate sampler calibration method. The variations in the measurement of the sampler impulse response using the ntn method are described and the assertion that the kick-out pulse is identical to the sampler impulse response is assessed. Temperature effects on the ntn method are also examined. Finally, the effect of uncertainties in the ntn calibration method on the uncertainties in reported pulse parameters is examined.
Keywords: sampler calibration, nose-to-nose, kick-out pulse, offset voltage
——————————————————————————————————————————————————————————
Software: LabVIEW VI to control the Fingerprint Force Measurement System
Description: This LabVIEW 2014 VI controls the FFMS
——————————————————————————————————————————————————————————
Software: LabVIEW VI to calculate the uncertainty in measurements made using the FFMS
Description: This LabVIEW 2014 VI calculates the uncertainty in the reported position (displacement and angle), force and torque from the FFMS.

Copyright © 2014 Entegra Corporation. All rights reserved.